Vestnik of the Russian New University

Series: Series "Complex Systems: models, analysis and management" — Issue 2022 №4 — Page 158–164 — Contents

Logic model for radiation degradation of microprocessor

Логическая модель деградации микропроцессора под воздействием излучения

Authors: D.I. Prikhodko
Authors: Д.И. Приходько
Journal: Vestnik of the Russian New University
Issue: 2022, №4
Pages: 158-164

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